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07 February – Searching in DWPI Chemistry Resource (DCR)
23 February – Searching in DWPI Chemistry Resource (DCR)
06 March – Numeric Property Searching in STN Patent Databases
20 March – Introduction à Derwent World Patents Index (DWPI)
22 March – Numeric Property Searching in STN Patent Databases
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6 March – Einführung in CAplus
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13 March – Einführung in CAplus
14 March – REGISTRY-Grundlagenkurs
15 March – Struktursuche in REGISTRY


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08 February – Patentstrategien in Pharmafirmen, Rechtsstandsinformationen in STN-Datenbanken
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21 March – Engineering-Informationen bei STN

STN Retrieval Language

27 March – Kompaktseminar
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14 March – STN Basics
22 March – Advanced Structure Searching on STN
28 March – STN Intermediate
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STNewsline February 2012 - Table of Contents

Database News

  • Latest Manual Code Revision goes live in Derwent World Patents Index® (DWPI®)
  • IFICLS Updates Resume on STN®  - change of dates
  • New format RE displays citations of patent and non-patent literature from INPADOCDB in Patent Full-text Files
  • INPADOC databases enhanced with Japanese Patent Classifications, current US Classification, and Japanese legal status
  • MEDLINE Reload - Updated MeSH Vocabulary and Two New Fields on STN®

Take Note

  •  Improve your STN® AnaVistTM skills - Concept Frequency

Meet us at

  • Join STN at the IPI-ConfEx 2012 in Barcelona

Database News

Latest Manual Code Revision goes live in Derwent World Patents Index® (DWPI®)

The DWPI manual coding system annual revision has now been completed and is being used by the Editorial Teams to code records appearing in the database from DWPI Update 201201 onwards.
Read the full article

IFICLS Updates Resumed on STN® - change of dates

Updates to the IFICLS database have resumed. The database was updated the week of January 23, 2012 with coverage from April 21 – December 27, 2011. The next update covers data from December 28, 2011 – January 20, 2012 and was made on January 24, 2012. Regular weekly updates resumed on January 27, 2012.

Monthly SDI runs for IFICLS resumed on February 1, 2012.

For the latest update information, type NEWS FILE at an arrow prompt within the IFICLS database or contact your local STN Service Center.

New format RE displays citations of patent and non-patent literature from INPADOCDB in Patent Full-text Files

RE (reference) is a new display format in the patent full text files PCTFULL, FRFULL, GBFULL, and AUPATFULL. If citations of patent or non-patent literature are available in the corresponding INPADOCDB record, they are displayable with the command => D RE.

INPADOC databases enhanced with Japanese Patent Classifications, current US Classification, and Japanese legal status

The coverage of major patent classifications in INPADOC has significantly been enhanced with the addition of the Japanese patent classifications (FI-terms and F-terms), providing a considerable value to Japanese patent and utility model publications. At the same time the current US patent classification codes have been included into INPADOC, complementing the set of issued US classification codes. Prior art searching is now much more reliable for Japanese and US patent documents.
The Japanese Patent Office (JPO) applies two completely independent national classification systems to classify Japanese patents and utility models: the IPC-based FI classification and the F-term classification. Both Japanese patent classifications became available in INPADOC on STN, providing an extremely useful tool to access Japanese patent literature. The Japanese patent classifications are available for 15 million Japanese patents and utility models back to 1965.
The coverage of the US national patent classification in INPADOC has been extended to include the current US classification codes for 9,3 million US applications. These codes are available for the complete backfile of US patent documents back to 1836.
For further details and search examples see the INPADOC News 2012/02.

The European Patent Office has just started to provide legal status data for Japanese patents and utility models back to April 2011. We expect more than 90 different legal status events for Japanese publications. Use EXPAND JP/LSC to see a list of all Japanese legal status codes currently available in INPADOC.


MEDLINE Reload - Updated MeSH Vocabulary and Two New Fields on STN®

New features and enhancements are now available with the STN reload of MEDlars onLINE (MEDLINE/LMEDLINE), produced by the U.S. National Library of Medicine (NLM).

Revised 2012 MeSH

The revised MeSH (Medical Subject Headings) vocabulary for 2012 was loaded on STN on December 11, 2011. MEDLINE records have been completely updated using the 2012 version of the MeSH vocabulary. 

Changes to the MeSH vocabulary include:

•    454 new terms
•    42 terms replaced by more up-to-date vocabulary 
•    15 deleted terms
For the most comprehensive searching in MEDLINE, consult the updated MeSH thesaurus for new or better search terms.

Review your SDIs running in MEDLINE with the new MeSH vocabulary to determine whether updating is necessary.

New Search Fields

The new RE.EX and RAU.EX search fields provide expanded capabilities for searching cited reference and cited reference author information.

RAU.EX Search Field

MEDLINE searches using the new RAU.EX field automatically retrieve reference author names with single initials even when multiple initials are used in the search query. This expands the number of results retrieved. 
     => S WELSH T H?/RAU
     L22         19 WELSH T H?/RAU

     => S WELSH T H?/RAU.EX
                 51 WELSH T?/RAU
                 19 WELSH T H?/RAU
     L23         51 WELSH T H?/RAU.EX
                      (WELSH T?/RAU OR WELSH T H?/RAU)

The new RE.EX field for cited references works similarly to the RAU.EX search field for cited reference authors.

Evaluate the relevance of additional results retrieved using RE.EX and RAU.EX.

Take Note

Improve your STN® AnaVistTM skills

Concept frequency
Concept frequency in STN AnaVist is a percentage, typically ranging from 10 to 70 percent, that indicates the upper limit of the frequency of terms used for clustering, which is an important part of creating the research landscape.

Suppose your STN AnaVist project consisted of 1,000 documents, and the term tomato occurred in 500 of the documents. The concept frequency for tomato would then be 500/1,000, or 50 percent.

Here’s why the concept frequency is important. Imagine you set your STN AnaVist project to use a concept frequency of 40 percent. That means that terms appearing in 40 percent of the documents or more are excluded from consideration when the research landscape is being created. From our example, the term tomato would not be used as a label in one of the peaks in your landscape. It also would not be included in the list of terms associated with a peak that you see when you hover over it.

You’ve probably run across this if you noticed that the search terms used to create your document set (in STN Express or STN on the WebSM) for analysis in STN AnaVist are rarely found in your research landscape.
You can find the concept frequency setting for your project at the bottom left corner of the STN AnaVist interface.


While there is no optimum concept frequency for all STN AnaVist projects, altering the concept frequency can result in more pronounced peaks and less scatter in your research landscape.
You may also try a few alternatives. Creating alternative research landscapes (via subset visualizations) is free, and a great way to get value from your STN AnaVist project. Alternative research landscapes may make it easier for you to study and/or interpret your landscapes.

Meet us at

Join STN at the IPI-ConfEx 2012 in Barcelona

We'd like to invite you to join STN at the 2012 IPI-ConfEx where we will be featuring our products and services in the Exhibition Hall. Robert Austin, STN European Training Manager, will conduct a workshop on "Numeric Property Searching in STN Patent Database".

The 9th annual IPI-ConfEx, International Patent Information Conference and Exhibition, takes place at the Hotel Fira Palace in Barcelona, Spain,11-15 March 2012.

Bringing together patent information’s thought leaders; IPI-ConfEx is the not-to-be missed meeting in 2012. Featuring outstanding speakers, interactive sessions, excellent networking opportunities and more! 

For further information, and to register, please visit

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